Scanning Electron Microscopy with Energy Dispersive Spectroscopy
Scanning Electron Microscopy (SEM) provides information on microstructure and morphology while the purpose of Energy Dispersive x-ray Spectroscopy (EDS) is to provide micro chemical information. Typical applications include analyzing surfaces for contamination, characterizing fracture surfaces, and measuring and identifying submicroscopic areas.
MRA’s state-of-the-art Digital Imaging / EDS system allows images to be collected and displayed in a format that enhances the detail of the material being studied. Digital elemental distribution maps can be collected with the acquisition of the electron image. The x-ray analysis program allows collection of the spectrum and accurate identification of the materials being examined. A spectrum of the complete image or a spotlight portion of that image can easily be examined.
Our SEM-EDS system is capable to perform high quality observations up to 30,000x magnification and analyze compositional makeup of the observed phases.