MRA Laboratories, Inc. offers a broad spectrum of electrical characterization tools to evaluate dielectric materials and measure their performance in passive electronic components at variable temperatures, voltages, and frequencies.
Dielectric Constant, Dissipation Factor, and Insulation Resistance
The primary properties of any dielectric materials are Dielectric Constant (K), Dissipation Factor (DF), and Insulation Resistance (IR). The dielectric constant or relative permittivity is the ratio of the amount of electrical energy stored in a material by an applied voltage, relative to that stored in a vacuum. The dissipation factor or dielectric loss is a parameter of a dielectric material that quantifies its inherent dissipation of electromagnetic energy. It is the portion of the energy wasted as heat in the capacitor. The insulation resistance is the current resistance between two electrical conductors or two systems of conductors separated by an insulating material.
Temperature Coefficient of Capacitance
Temperature Coefficient of Capacitance (TCC) describes the maximum chance in capacitance over a specified temperature range. The capacitance value of the capacitor stated by the manufacturer is established at a reference temperature of 25C. TCC should always be considered for applications above or below this temperature.
We have a capability to measure TCC characteristics of the dielectric materials in the wide temperature range from -100C to 600C at variable frequencies and dc-biases.
Dielectric Breakdown Strength
Dielectric Strength is a measure of the electrical strength of a material as an insulator. Dielectric strength is defined as the maximum voltage required to produce a dielectric breakdown through the material and is expressed as Volts per unit thickness. A higher dielectric strength represents a better quality of insulator.
We have a capability to measure ac- and dc-voltage breakdown strength with maximum applied voltage of 5,000Vac and 6,000Vdc .
Highly Accelerated Life Test
Highly Accelerated Life Testing (HALT) is a rigorous reliability test method that is used to expose product weaknesses. The goal of HALT is to proactively find weaknesses and fix them, thereby increasing product reliability. Because of its accelerated nature, HALT is typically faster and less expensive than traditional testing techniques. MRA widely employs HALT to estimate the reliability of variable dielectric materials at elevated temperature and voltage conditions.
We have a capability to simultaneously measure multiple samples at a wide temperature and dc-voltage stress conditions. Our computer controlled HALT systems are capable to operate at up to 350C and apply up to 1,000V dc-bias to the test samples.